Event Information

Instruments, Standard Methods and Reference Materials for Traceable Nanoparticle Characterisation

28 April 2010 to 29 April 2010
Nuremburg, Germany

This scientific workshop will bring together all stakeholders involved in engineered nanoparticle (ENP) metrology, such as manufacturers of ENPs, (eco)toxicologists, developers of measurement techniques, representatives of standardisation bodies and authorities. It takes place parallel to the 6th World Congress on Particle Technology/PARTEC and the international exhibitions POWTECH and TechnoPharm, where latest developments in processing and characterising of particle systems are presented. We believe that the workshop will benefit from this gathered expertise when formulating the current and future needs in nanoparticle metrology. After the workshop a report will be published with excerpts from all talks and subsequent discussions.

Workshop structure

* Fundamentals of ENP characterisation (terminology, metrology aspects)
* Objectives and boundary conditions of ENP characterisation (process control, tox and ecotox)
* ENP characterisation in liquid media - sizing (survey, important methods)
* ENP characterisation in liquid media - interfacial properties (background, zeta potential, agglomeration)
* Characterisation of airborne ENPs
* Reference materials

Website: http://www.nanoparticle-metrology.de