Event Information

13th International Conference on Metrology and Properties of Engineering Surfaces

12 April 2011 to 14 April 2011
National Physical Laboratory, UK

First Announcement and Call for Papers
The 13th International Conference on Metrology and Properties of Engineering Surfaces is a prestigious international conference, focusing on progress in surface metrology, surface characterisation instrumentation and properties of engineering surfaces.

The conference provides an international forum for industrialists, academics and engineers from different disciplines to meet and exchange ideas, results and latest research.

Call for Papers
The conference agenda will include invited and contributed papers. Authors are invited to submit one-page abstracts no later than 16 August 2010 by post or e-mail MetProp2011@npl.co.uk on any of the following themes:

• Surface, micro and nano metrology
• Measurement and instrumentation
• Metrology for MST devices
• Freeform surface measurement and characterisation
• Uncertainty, traceability and calibration
• AFM/SPM metrology
• Tribology and wear phenomena
• Functional applications
• Stylus and optical Instruments

If you would like to submit a paper, full details can be found on the website below.

Sponsorship, registration and exhibiting
We are expecting a large number of delegates to attend the conference. There is an opportunity for sponsors to support the events. Please contact the Conference Secretariat Gill Roe: MetProp2011@npl.co.uk for further information.

Website: http://conferences.npl.co.uk/met_prop/abstract_paper.html

Download: News-and-events/members events/NPL Met and Props Flyer April 2011 (pdf)